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Oral presentation

Fabrication of high-quality thin film of semiconducting silicide by use of ion beams

Hamamoto, Satoshi*; Yamaguchi, Kenji; Hojo, Kiichi

no journal, , 

no abstracts in English

Oral presentation

Determination of technetium-99 in liquid wastes of Fukushima-Daiichi Nuclear Power Plant by solid extraction-ICP AES method

Suwa, Toshio; Okano, Masanori; Jitsukata, Shu*; Nemoto, Hirokazu*; Kuno, Takehiko; Kurosawa, Akira

no journal, , 

no abstracts in English

Oral presentation

Selective analysis of higher enriched uranium particles in environmental samples with secondary ion mass spectrometry

Esaka, Fumitaka; Magara, Masaaki; Kimura, Takaumi

no journal, , 

Isotopic composition of elements in environmental samples gives important information on the origin of particles. In particular, we can deduce the nuclear activities by analyzing isotopic composition of U and Pu in particles taken at nuclear facilities. In this study, we have developed fission track and automated particle measurement techniques as screening methods for subsequent isotopic ratio analysis with secondary ion mass spectrometry. Then, the developed methods have been applied to the analysis of reference materials and real environmental samples. As the result, we have confirmed that these methods are effective to analyze higher enriched uranium particles in environmental samples.

Oral presentation

Non-destructive depth profile analysis of buried interface by using neutron beam

Yamamoto, Hiroyuki; Matsue, Hideaki; Esaka, Fumitaka; Sasase, Masato*

no journal, , 

Non-destructive depth profile analysis of buried interface by using neutron beam has been applied for buried boron layer in silicon.

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