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Hamamoto, Satoshi*; Yamaguchi, Kenji; Hojo, Kiichi
no journal, ,
no abstracts in English
Suwa, Toshio; Okano, Masanori; Jitsukata, Shu*; Nemoto, Hirokazu*; Kuno, Takehiko; Kurosawa, Akira
no journal, ,
no abstracts in English
Esaka, Fumitaka; Magara, Masaaki; Kimura, Takaumi
no journal, ,
Isotopic composition of elements in environmental samples gives important information on the origin of particles. In particular, we can deduce the nuclear activities by analyzing isotopic composition of U and Pu in particles taken at nuclear facilities. In this study, we have developed fission track and automated particle measurement techniques as screening methods for subsequent isotopic ratio analysis with secondary ion mass spectrometry. Then, the developed methods have been applied to the analysis of reference materials and real environmental samples. As the result, we have confirmed that these methods are effective to analyze higher enriched uranium particles in environmental samples.
Yamamoto, Hiroyuki; Matsue, Hideaki; Esaka, Fumitaka; Sasase, Masato*
no journal, ,
Non-destructive depth profile analysis of buried interface by using neutron beam has been applied for buried boron layer in silicon.